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BS EN IEC 60384-21:2024 Fixed capacitors for use in electronic equipment - Sectional specification. Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1, 2024
- undefined
- Annex ZA (normative)Normative references to international publicationswith their corresponding European publications [Go to Page]
- English [Go to Page]
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Preferred ratings and characteristics [Go to Page]
- 4.1 Preferred characteristics
- 4.2 Preferred values of ratings [Go to Page]
- 4.2.1 Rated temperature (TR)
- 4.2.2 Rated voltage (UR)
- 4.2.3 Category voltage (UC)
- 4.2.4 Preferred values of nominal capacitance and associated tolerance values
- Tables [Go to Page]
- Table 1 – Preferred tolerances on nominal capacitance [Go to Page]
- 4.2.5 Temperature coefficient (α)
- Table 2 – Nominal temperature coefficient and tolerance (for reference temperature 20 °C)
- Table 3 – Combination of temperature coefficient and tolerance [Go to Page]
- 4.2.6 Dimensions
- 5 Test and measurement procedures [Go to Page]
- 5.1 General
- 5.2 Preliminary drying
- 5.3 Measuring conditions
- 5.4 Mounting
- 5.5 Visual examination and check of dimensions [Go to Page]
- 5.5.1 General
- 5.5.2 Visual examination
- 5.5.3 Requirements
- Figures [Go to Page]
- Figure 1 – Fault: crack or fissure
- Figure 2 – Fault: crack or fissure
- Figure 3 – Separation or delamination
- Figure 4 – Exposed electrodes
- 5.6 Electrical tests [Go to Page]
- 5.6.1 Capacitance
- 5.6.2 Tangent of loss angle (tan δ)
- Figure 5 – Principal faces [Go to Page]
- 5.6.3 Insulation resistance
- Table 4 – Tangent of loss angle limits [Go to Page]
- 5.6.4 Voltage proof
- 5.7 Temperature coefficient (α) and temperature cyclic drift [Go to Page]
- 5.7.1 General
- Table 5 – Test voltages [Go to Page]
- 5.7.2 Preliminary drying
- 5.7.3 Measuring conditions
- 5.7.4 Requirements
- 5.8 Shear test
- 5.9 Substrate bending test [Go to Page]
- 5.9.1 General
- 5.9.2 Initial measurement
- Table 6 – Temperature cyclic drift limits [Go to Page]
- 5.9.3 Final inspection
- 5.10 Resistance to soldering heat [Go to Page]
- 5.10.1 General
- 5.10.2 Initial measurement
- 5.10.3 Test conditions
- 5.10.4 Recovery
- 5.10.5 Final inspection, measurements and requirements
- Figure 6 – Reflow temperature profile
- Table 7 – Reflow temperature profiles for Sn-Ag-Cu alloy
- Table 8 – Maximum capacitance change
- 5.11 Solderability [Go to Page]
- 5.11.1 General
- 5.11.2 Test conditions
- 5.11.3 Recovery
- 5.11.4 Final inspection, measurements and requirements
- 5.12 Rapid change of temperature [Go to Page]
- 5.12.1 General
- 5.12.2 Initial measurement
- 5.12.3 Number of cycles
- 5.12.4 Recovery
- 5.12.5 Final inspection, measurements and requirements
- 5.13 Climatic sequence [Go to Page]
- 5.13.1 General
- 5.13.2 Initial measurement
- Table 9 – Maximum capacitance change [Go to Page]
- 5.13.3 Dry heat
- 5.13.4 Damp heat, cyclic, Test Db, first cycle
- 5.13.5 Cold
- 5.13.6 Damp heat, cyclic, Test Db, remaining cycles
- 5.13.7 Final inspection, measurements and requirements
- Table 10 – Number of damp heat cycles
- Table 11 – Final inspection, measurements and requirements
- 5.14 Damp heat, steady state [Go to Page]
- 5.14.1 General
- 5.14.2 Initial measurement
- 5.14.3 Test conditions
- 5.14.4 Recovery
- 5.14.5 Final inspection, measurements and requirements
- Table 12 – Test conditions for damp heat, steady state
- 5.15 Endurance [Go to Page]
- 5.15.1 General
- 5.15.2 Initial measurement
- 5.15.3 Test conditions
- Table 13 – Final inspection, measurements and requirements
- Table 14 – Endurance test conditions (UC = UR) [Go to Page]
- 5.15.4 Recovery
- 5.15.5 Final inspection, measurements and requirements
- 5.16 Robustness of terminations (only for capacitors with strip termination) [Go to Page]
- 5.16.1 General
- 5.16.2 Test conditions
- Table 15 – Endurance test conditions (UC ≠ UR)
- Table 16 – Final inspection, measurements and requirements [Go to Page]
- 5.16.3 Final inspection and requirements
- 5.17 Component solvent resistance (if required)
- 5.18 Solvent resistance of the marking (if required)
- 5.19 Accelerated damp heat, steady state (if required) [Go to Page]
- 5.19.1 General
- 5.19.2 Initial measurement
- 5.19.3 Conditioning
- Table 17 – Initial requirements [Go to Page]
- 5.19.4 Recovery
- 5.19.5 Final measurements
- 6 Marking [Go to Page]
- 6.1 General
- 6.2 Information for marking
- 6.3 Marking on the body
- 6.4 Requirements for marking
- Table 18 – Conditioning
- 6.5 Marking of the packaging
- 6.6 Additional marking
- 7 Information to be given in a detail specification [Go to Page]
- 7.1 General
- 7.2 Outline drawing and dimensions
- 7.3 Mounting
- 7.4 Rating and characteristics [Go to Page]
- 7.4.1 General
- 7.4.2 Nominal capacitance range
- 7.4.3 Particular characteristics
- 7.4.4 Soldering
- 7.5 Marking
- 8 Quality assessment procedures [Go to Page]
- 8.1 Primary stage of manufacture
- 8.2 Structurally similar components
- 8.3 Certified records of released lots
- 8.4 Qualification approval [Go to Page]
- 8.4.1 General
- 8.4.2 Qualification approval on the basis of the fixed sample size procedures
- 8.4.3 Tests
- Table 19 – Fixed sample size test plan for qualification approval Assessment level EZ
- Table 20 – Tests schedule for qualification approval
- Annexes [Go to Page]
- Annex A (normative) Guidance for the specification and coding of dimensions of fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
- Figure A.1 – Dimensions
- Table A.1 – Dimensions
- Annex B (normative) Combination of temperature coefficients and tolerances for the reference temperature of 25 °C
- Table B.1 – Combination of temperature coefficients and tolerances for the reference temperature of 25 °C
- Annex C (normative) Quality conformance inspection [Go to Page]
- C.1 Formation of inspection lots [Go to Page]
- C.1.1 Groups A and B inspection
- C.1.2 Group C inspection
- C.2 Test schedule
- C.3 Delayed delivery
- C.4 Assessment levels
- C.5 Test schedule for quality conformance inspection
- Table C.1 – Lot by lot inspection
- Table C.2 – Periodic inspection
- Table C.3 – Test schedule for quality conformance inspection (lot by lot)
- Table C.4 – Test schedule for quality conformance inspection (Periodic test)
- Annex X (informative) Cross-reference for reference to IEC 60384-21:2019
- Table X.1 – Reference to IEC 60384-21 for clause/annex
- Table X.2 – Reference to IEC 60384-21 for figure/table
- Bibliography [Go to Page]
