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  • BSI
    BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection
    Edition: 2023
    $313.97
    / user per year

Description of BS EN IEC 63364-1:2022 2023

This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

Standard NumberBS EN IEC 63364-1:2022
TitleSemiconductor devices. Semiconductor devices for IoT system - Test method of sound variation detection
StatusDefinitive
Publication Date2023-02-02
Identical National Standard OfEN 63364-1 Ed.1.0, IEC 63364-1 Ed.1.0
DescriptorsSemiconductor devices, Semiconductors, Test methods, Evaluation, Electronic equipment and components
ICS31.080.01 Semiconductor devices in general, 31.080.99 Other semiconductor devices
CommitteeEPL/47
ISBN978 0 539 16660 6
PublisherBSI
Pages18

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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