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  • BSI
    BS EN IEC 60749-5:2024 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
    Edition: 2024
    $439.53
    / user per year

Description of BS EN IEC 60749-5:2024 - TC 2024

IEC 60749-5:2023 is available as IEC 60749-5:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 60749-5:2023 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) The specification of the test equipment is changed to require the need to minimize relative humidity gradients and maximize air flow between semiconductor devices under test; b) The specification of the test equipment fixtures is changed to require the avoidance of condensation on devices under test and on electrical fixtures connecting the devices to the test equipment; c) replacement of references to “virtual junction” with “die”.

Standard NumberBS EN IEC 60749-5:2024 - TC
TitleTracked Changes. Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
StatusDefinitive
Publication Date2024-02-09
ReplacesBS EN 60749-5:2017 - TC
DescriptorsMechanical testing, Semiconductor devices, Test methods, Temperature, Humidity
ICS31.080.01 Semiconductor devices in general
CommitteeEPL/47
ISBN978 0 539 30521 0
PublisherBSI
Pages34

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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