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  • BSI
    BS EN IEC 60749-41:2020 Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices
    Edition: 2020
    $435.35
    / user per year

Description of BS EN IEC 60749-41:2020 2020

This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.



Standard NumberBS EN IEC 60749-41:2020
TitleSemiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices
StatusDefinitive
Publication Date2020-09-09
Identical National Standard OfEN 60749-41, IEC 60749-41
DescriptorsFlammability, Moisture measurement, Defects, Solderability testing, Storage, Testing conditions, Visual inspection (testing), Marking, Stress, Fire tests, Test equipment, Vibration testing, Temperature measurement, Specimen preparation, Semiconductor devices, Accelerated testing, Bonding, Electric terminals, Electrical testing, Endurance testing, Test specimens, Thermal-shock tests, Environmental testing, Strength of materials, Mass spectrometry, Classification systems, Integrated circuits, Damp-heat tests, Shear testing, Low-pressure tests, Thermal testing, Mechanical testing, Leak tests, Radioactive tracer methods, Electronic equipment and components, Pull-out tests, Dimensional measurement, Torsion testing
ICS31.080.01 Semiconductor devices in general
CommitteeEPL/47
ISBN978 0 580 96287 5
PublisherBSI
Pages26

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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