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  • BSI
    BS EN 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Guidelines for IC reliability qualification plans
    Edition: 2017
    $442.60
    / user per year

Description of BS EN 60749-43:2017 2017

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Standard NumberBS EN 60749-43:2017
TitleSemiconductor devices - Mechanical and climatic test methods - Guidelines for IC reliability qualification plans
StatusWithdrawn
Publication Date2017-09-22
Withdrawn Date2022-07-29
Replaced ByBS EN IEC 63287-1:2021
Identical National Standard OfIEC 60749-43:2017, EN 60749-43:2017
DescriptorsReliability, Climatic protection, Mechanical classifiers, Semiconductor materials, Semiconductor technology
ICS31.080.01 Semiconductor devices in general
CommitteeEPL/47
ISBN978 0 580 80345 1
PublisherBSI
Pages44

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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