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  • BSI
    BS EN 60444-6:2013 Measurement of quartz crystal unit parameters - Measurement of drive level dependence (DLD)
    Edition: 2013
    $435.35
    / user per year

Description of BS EN 60444-6:2013 2013

IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.

Standard NumberBS EN 60444-6:2013
TitleMeasurement of quartz crystal unit parameters - Measurement of drive level dependence (DLD)
StatusUnder Review
Publication Date2013-10-31
ReplacesBS EN 60444-6:1997
Identical National Standard OfEN 60444-6:2013, IEC 60444-6:2013
DescriptorsResonance, Current measurement, Power measurement (electric), Electrical testing, Electrical measurement, Mathematical calculations, Testing conditions, Crystal resonators, Circuits, Test equipment, Dielectric devices, Resistance measurement, Formulae (mathematics), Piezoelectric devices
ICS31.140 Piezoelectric devices
CommitteeW/-
ISBN978 0 580 64890 8
PublisherBSI
Pages24

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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