Cart (0)
  • No items in cart.
Total
$0
There is a technical issue about last added item. You can click "Report to us" button to let us know and we resolve the issue and return back to you or you can continue without last item via click to continue button.
Home
Content
Tour
eLibrary
Store
Search book title
Filters:
BOOKS
All Books
PACKAGES
All Packages
EDITION
to
PUBLISHER
AABC
(1)
AAMI
(338)
ACI
(621)
AECDAILY
(599)
AISC
(55)
ASA
(234)
ASCE
(1006)
ASHRAE
(696)
ASME
(2187)
ASSE
(117)
ASTM
(95207)
AWC
(63)
AWWA
(590)
BHMA
(124)
BICSI
(33)
BIFMA
(24)
BOMA
(20)
BSI
(96195)
CRSI
(17)
IAHSS
(1)
IAPMO
(374)
ICC
(325)
IEEE
(7076)
IES
(241)
ISEA
(21)
Joint Commission
(184)
Joint Commission Int.
(1)
NETA
(7)
NFPA
(1669)
TCNA
(18)
TMS
(19)
USGBC
(28)
WILEY
(4)
 
AR
(6)
AZ
(7)
CA
(115)
CT
(3)
FL
(57)
ID
(5)
IL
(5)
IN
(1)
KY
(1)
LA
(2)
MI
(28)
MN
(27)
NC
(27)
NJ
(13)
NY
(61)
OH
(24)
OR
(22)
PA
(7)
RI
(8)
SC
(20)
SD
(1)
TX
(3)
VA
(50)
VT
(6)
WA
(33)
CONTENT TYPE
 Act
 Admin Code
 Announcements
 Bill
 Book
 CADD File
 CAN
 CEU
 Charter
 Checklist
 City Code
 Code
 Commentary
 Comprehensive Plan
 Conference Paper
 County Code
 Course
 DHS Documents
 Document
 Errata
 Executive Regulation
 Federal Guideline
 Firm Content
 Guideline
 Handbook
 Interpretation
 Journal
 Land Use and Development
 Law
 Legislative Rule
 Local Amendment
 Local Code
 Local Document
 Local Regulation
 Local Standards
 Manual
 Model Code
 Model Standard
 Notice
 Ordinance
 Other
 Paperback
 PASS
 Periodicals
 PIN
 Plan
 Policy
 Product
 Product - Data Sheet
 Program
 Provisions
 Requirements
 Revisions
 Rules & Regulations
 Standards
 State Amendment
 State Code
 State Manual
 State Plan
 State Standards
 Statute
 Study Guide
 Supplement
 Sustainability
 Technical Bulletin
 All
  • BSI
    BS EN 60444-11:2010 Measurement of quartz crystal unit parameters - Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    Edition: 2010
    $311.86
    / user per year

Description of BS EN 60444-11:2010 2010

This part of IEC 60444 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.

M, according to Table 1 of IEC 60122-1:2002, is expressed in the following equation:

This gives good results in a frequency range up to 200 MHz. This method allows the calculation of load resonance frequency offset ΔfL, frequency pulling range ΔfL1,L2 and pulling sensitivity S as described in 2.2.31 of IEC 60122-1:2002. In contrary to the simple method of IEC 60444-4, this measurement technique avoids the use of physical load capacitors, and allows higher accuracy, better reproducibility and correlation to the application. It extends the upper frequency limit from 30MHz by the method of IEC 60444-4 to 200MHz approximately. This method is based on the error-corrected measurement technique of IEC 60444-5:1995, and therefore allows the measurement of fL and CLeff together with the determination of the equivalent crystal parameters in one sequence without changing the test fixture.

With this method the frequency fL is searched where the reactance XC of the crystal has the opposite value of the reactance of the load capacitance.

Furthermore this method allows to determine the effective load capacitance CLeff at the nominal frequency fnom.



Standard NumberBS EN 60444-11:2010
TitleMeasurement of quartz crystal unit parameters - Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
StatusRevision Underway
Publication Date2010-12-31
Identical National Standard OfIEC 60444-11:2010, EN 60444-11:2010
DescriptorsResonance, Piezoelectric devices, Resonant frequency, Capacitance measurement, Error correction, Frequency measurement, Quartz, Calibration, Electrical measurement, Crystal resonators, Network analysis, Circuit networks, Dielectric devices
ICS31.140 Piezoelectric devices
CommitteeW/-
ISBN978 0 580 62682 1
PublisherBSI
Pages18
GROUPS
US LOCAL CODES
US Territory Code Adoptions / Amendments
District of Columbia
Guam
Northern Marianas Islands
Puerto Rico
US Virgin Islands
US State Code Adoptions / Amendments
AL AK AZ AR CA CO CT DE
FL GA HI ID IL IN IA KS
KY LA ME MD MA MI MN MS
MO MT NE NV NH NJ NM NY
NC ND OH OK OR PA RI SC
SD TN TX UT VT VA WA WV
WI WY       
X
01 02 03 04 05 06 07 08 09 10
11 12 13 14 15 16 17 18 19 20
21 22 23 24 25 26 27 28 29 30
31 32 33 34 35 36 37 38 39 40
41 42 43 44 45 46 47 48 49 50
51 52 53 54 55 56 57 58 59 60
61 62 63 64 65 66 67 68 69 70
71 72 73 74 75 76 77 78 79 80
81 82 83 84 85 86 87 88 89 90
91 92 93 94 95 96 97 98 99 100