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Description of ASTM-F744M 2010ASTM F744M-10Historical Standard: Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]ASTM F744MScope 1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC). 1.2 The precision of the measurement depends on the homogeneity of the radiation field and on the precision of the radiation dosimetry and the recording instrumentation. 1.3 The test may be destructive either for further tests or for purposes other than this test if the integrated circuit being tested absorbs a total radiation dose exceeding some predetermined level. Because this level depends both on the kind of integrated circuit and on the application, a specific value must be agreed upon by the parties to the test (6.8). 1.4 Setup, calibration, and test circuit evaluation procedures are included in this test method. 1.5 Procedures for lot qualification and sampling are not included in this test method. 1.6 Because of the variability of the response of different device types, the initial dose rate for any specific test is not given in this test method but must be agreed upon by the parties to the test. 1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.8 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish
appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Keywords DIC; digital integrated circuits; dose rate; ionizing radiation; radiation dose rate; threshold for upset; upset; Circuitry; Current measurement--semiconductors; Destructive testing--semiconductors; Dose rate threshold; Dosimetry; Electrical conductors (semiconductors); Electron linear accelerator; Flash X-ray machines (FXR); Irradiance/irradiation--semiconductors; Lasers and laser applications; Linear threshold voltage; Radiation exposure--electronic components/devices; Upset threshold; Voltage ICS Code ICS Number Code 31.200 (Integrated circuits. Microelectronics) DOI: 10.1520/F0744M-10 The following editions for this book are also available...This book also exists in the following packages...Subscription InformationMADCAD.com ASTM Standards subscriptions are annual and access is unlimited concurrency based (number of people that can access the subscription at any given time) from single office location. For pricing on multiple office location ASTM Standards Subscriptions, please contact us at info@madcad.com or +1 800.798.9296.
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About ASTMASTM International, formerly known as the American Society for Testing and Materials (ASTM), is a globally recognized leader in the development and delivery of international voluntary consensus standards. Today, some 12,000 ASTM standards are used around the world to improve product quality, enhance safety, facilitate market access and trade, and build consumer confidence. ASTM’s leadership in international standards development is driven by the contributions of its members: more than 30,000 of the world’s top technical experts and business professionals representing 150 countries. Working in an open and transparent process and using ASTM’s advanced electronic infrastructure, ASTM members deliver the test methods, specifications, guides, and practices that support industries and governments worldwide. |
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