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  • ASTM
    F1996-00 Standard Test Method for Silver Migration for Membrane Switch Circuitry
    Edition: 2000
    $91.10
    Unlimited Users per year

Description of ASTM-F1996 2000

ASTM F1996-00

Historical Standard: ASTM F1996-00 Standard Test Method for Silver Migration for Membrane Switch Circuitry

SUPERSEDED (see Active link, below)




ASTM F1996

1. Scope

1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.


2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

ASTM Standards

F1596 Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity

F1689 Test Method for Determining the Insulation Resistance of a Membrane Switch


Keywords

membrane switch; silver dendrite; silver migration;


ICS Code

ICS Number Code 77.120.99 (Other non-ferrous metals and their alloys)


DOI: 10.1520/F1996-00

ASTM International is a member of CrossRef.


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About ASTM

ASTM International, formerly known as the American Society for Testing and Materials (ASTM), is a globally recognized leader in the development and delivery of international voluntary consensus standards. Today, some 12,000 ASTM standards are used around the world to improve product quality, enhance safety, facilitate market access and trade, and build consumer confidence. ASTM’s leadership in international standards development is driven by the contributions of its members: more than 30,000 of the world’s top technical experts and business professionals representing 150 countries. Working in an open and transparent process and using ASTM’s advanced electronic infrastructure, ASTM members deliver the test methods, specifications, guides, and practices that support industries and governments worldwide.
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