ASTM E1829-97
Historical Standard: ASTM E1829-97 Standard Guide for Handling Specimens Prior to Surface Analysis
SUPERSEDED (see Active link, below)
ASTM E1829
1. Scope
1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:
1.1.1 Auger electron spectroscopy (AES),
1.1.2 X-ray photoelectron spectroscopy (XPS or ESCA), and
1.1.3 Secondary ion mass spectrometry, SIMS.
1.1.4 Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
ASTM Standards
E673 Terminology Relating to Surface Analysis
E1078 Guide for Specimen Preparation and Mounting in Surface Analysis
Keywords
Auger electron spectroscopy; secondary ion mass spectrometry; specimen handling; surface analysis; X-ray photoelectron spectroscopy; Specimen preparation (for testing)--spectrochemical analysis; Surface analysis--spectrochemical analysis; Auger electron spectroscopy (AES); SIMS (secondary ion mass spectrometry); X-ray photoelectron spectroscopy (XPS);
ICS Code
ICS Number Code 71.040.50 (Physicochemical methods of analysis)
DOI: 10.1520/E1829-97
ASTM International is a member of CrossRef.
