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PD IEC TS 62607-8-4:2024 Nanomanufacturing. Key control characteristics - Metal-oxide interfacial devices. Activation energy of electronic trap states: Low-frequency-noise spectroscopy >
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PD IEC TS 62607-8-4:2024 Nanomanufacturing. Key control characteristics - Metal-oxide interfacial devices. Activation energy of electronic trap states: Low-frequency-noise spectroscopy, 2024
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- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms, definitions, and abbreviated terms [Go to Page]
- 4 General [Go to Page]
- Figures [Go to Page]
- 5 Measurement procedure
- Tables [Go to Page]
- 6 Data analysis and interpretation of results [Go to Page]
- 7 Reporting data
- Annex A (informative) Case study: Low-frequency-noise spectroscopy measurement of metal-oxide interfacial device [Go to Page]
- Annex B (informative) Case study: Low-frequency-noise spectroscopy measurement of metal-oxide interfacial device [Go to Page]
- Annex C (informative) Case study: Low-frequency-noise spectroscopy measurement of metal-oxide interfacial device (electrochemical-type [6]) [Go to Page]
- Bibliography [Go to Page]
