eLibrary >
PD IEC TR 62240-2:2018 Process management for avionics. Electronic components capability in operation - Semiconductor microcircuit lifetime >
Expand All
TOC Search:
PD IEC TR 62240-2:2018 Process management for avionics. Electronic components capability in operation - Semiconductor microcircuit lifetime, 2018
- undefined
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms, definitions and abbreviated terms [Go to Page]
- 4 Lifetime assessment process and method [Go to Page]
- Figure 1 – Process flow for lifetime assessment and selection ofCOTS semiconductor microcircuits [Go to Page]
- 5 Considerations with regard to semiconductor ageing level estimation for semiconductor microcircuits
- Annex A (informative)Failure and degradation mechanisms ofCOTS semiconductor microcircuits
- Tables [Go to Page]
- Annex B (informative)Example of operating and thermal mission profile for a COTS semiconductor microcircuit
- Figure B.1 – Example of thermal and operating mission profile for a semiconductormicrocircuit implemented in an electronic equipment located on the avionic bayof a civil aircraft, assuming 30 °C of thermal dissipation
- Annex C (informative)Risk of failure and degradation mechanisms accordingto the type of COTS semiconductor microcircuit [Go to Page]
- Annex D (informative)BEOL and FEOL technological parameters [Go to Page]
- Annex E (informative)Generic acceleration models [Go to Page]
- Annex F (informative)Final report [Go to Page]
- Bibliography [Go to Page]
