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eLibrary > DD IEC/TS 62396-4:2008 Process management for avionics. Atmospheric radiation effects - Guidelines for designing with high voltage aircraft electronics and potential single event effects >

DD IEC/TS 62396-4:2008 Process management for avionics. Atmospheric radiation effects - Guidelines for designing with high voltage aircraft electronics and potential single event effects, 2009

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DD IEC/TS 62396-4:2008 Process management for avionics. Atmospheric radiation effects - Guidelines for designing with high voltage aircraft electronics and potential single event effects, 2009

iec62396-4%7Bed1.0%7Den.pdf [Go to Page]
CONTENTS
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Potential high voltage single event effects
5 Quantifying single event burnout in avionics for high voltage devices
6 Relevant SEB data and applying it to avionics [Go to Page]
6.1 SEB data from heavy ion testing is not relevant
6.2 SEB data from high energy neutron and proton testing
6.3 Calculating the SEB rate at aircraft altitudes
6.4 Measurement of high voltage component radiation characteristics, EPICS
7 Conclusion
Bibliography
Figure 1 – SEB cross sections measured in 400 V and 500 V MOSFETs for WNR neutron and proton beams
Figure 2 – SEB cross sections measured in 1 000 V MOSFETs and 1 200 V IGBTs with WNR neutron and 200 MeV proton beams
Figure 3a – Application of EPICS to the measurement of radiation event induced charge
Figure 3b – Application of EPICS to the measurement of radiation event induced current
Figure 3 – Measurement of radiation event charge and current
Figure 4 – EPICS plot of 1 200 V diode numbers of events at currents taken at different applied voltages for a neutron fluence of approximately 3,5 x 109 neutrons per cm2 measured at energies greater than 10 MeV
Figure 5 – EPICS plot of 1 200 V diode numbers of events at currents taken at 675 V (56 %) and 900 V (75 %) applied voltage (stress) demonstrating the difference between low and high voltage stress – Fluence as per Figure 4 [Go to Page]

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DD IEC/TS 62396-4:2008 Process management for avionics. Atmospheric radiation effects - Guidelines for designing with high voltage aircraft electronics and potential single event effects, 2009

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