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eLibrary > BS ISO 3951-1:2022 - TC Tracked Changes. Sampling procedures for inspection by variables - Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL >

BS ISO 3951-1:2022 - TC Tracked Changes. Sampling procedures for inspection by variables - Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL, 2022

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BS ISO 3951-1:2022 - TC Tracked Changes. Sampling procedures for inspection by variables - Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL, 2022

National foreword [Go to Page]
Contractual and legal considerations
Compliance with a British Standard cannot confer immunity from legal obligations.
Amendments/corrigenda issued since publication
COPYRIGHT PROTECTED DOCUMENT
Foreword
Introduction [Go to Page]
CAUTION — The procedures in this part of ISO 3951document are not suitable for application to lots that have been screened for nonconforming items. [Go to Page]
Table 1 — Summary table
INTERNATIONAL STANDARD ISO 3951-1:2013ISO 3951-1:2022(E)
1 Scope
2 Normative references
3 Terms and definitions [Go to Page]
3.1
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
3.10
3.11
3.12 [Go to Page]
3.123.13
3.133.14
3.143.15 [Go to Page]
L
3.153.16 [Go to Page]
U
3.163.17
3.173.18 [Go to Page]
k
3.19
3.183.20 [Go to Page]
Q
3.193.21
3.203.22 [Go to Page]
3.21
3.223.23
3.233.24
3.243.25
4 Symbols [Go to Page]
5 Acceptance quality limit (AQL) [Go to Page]
5.1 Concept
5.2 Use
5.3 Specifying AQLs
5.4 Preferred AQLs
5.5 Caution
5.6 Limitation
5 Choice of a sampling plan [Go to Page]
5.1 Choice between variables and attributes
5.2 General
5.3 Choice between the s-method and σ-method
5.4 Choice of inspection level and AQL
6 Standard procedures for the s-method [Go to Page]
6.1 General
6.2 Single specification limits
6.3 Double specification limits
7 Standard procedures for the σ-method [Go to Page]
7.1 General
7.2 Single specification limits
7.3 Double specification limits
8 The p*-method
6 Switching rules for normal, tightened, and reduced inspection
9 Switching between inspection severities [Go to Page]
9.1 Rules for switching between inspection severities
9.2 Records for switching between inspection severities
710 Relation to ISO 2859-1 [Go to Page]
7.110.1 Similarities
7.210.2 Differences
8 Consumer protection [Go to Page]
8.1 Use of individual plans
8.2 Consumer’s risk quality (CRQ) tables
8.3 Producer’s risk tables
8.4 Operating characteristic (OC) curves
911 Allowing for measurement uncertainty [Go to Page]
10 Planning
11 Choice between variables and attributes
12 Choice between the s-method and σ-method
12 Normality, data transformations and outliers [Go to Page]
12.1 Normality
12.2 Data transformations
12.3 Outliers
13 Choice of inspection level and AQL
13 Monitoring and recording of inspection results [Go to Page]
13.1 Monitoring of inspection results
13.2 Process capability and performance assessment
13.3 Monitoring of process parameters
14 Choice of sampling scheme [Go to Page]
14.1 Standard plans
14.2 Special plans
14 Tables [Go to Page]
14.1 Form k for single sampling plans: s-method [Go to Page]
Table 2 — Single sampling plans of form k for normal inspection: s–method
Table 3 — Single sampling plans of form k for tightened inspection: s–method
Table 4 — Single sampling plans of form k for reduced inspection: s–method
14.2 Form k for single sampling plans: σ-method [Go to Page]
Table 5 — Single sampling plans of form k for normal inspection: σ–method
Table 6 — Single sampling plans of form k for tightened inspection: σ–method
Table 6 (continued)
Table 7 — Single sampling plans of form k for reduced inspection: σ–method
Table 7 (continued)
14.3 Form p* single sampling plans [Go to Page]
Table 8 — Single sampling plans of form p* for normal inspection (ns sample size for s-method, nσ sample size for σ–method)
Table 9 — Single sampling plans of form p* for tightened inspection (ns sample size for s-method, nσ sample size for σ–method)
Table 10 — Single sampling plans of form p* for reduced inspection (ns sample size for s-method, nσ sample size for σ–method)
14.4 Values of fσ for maximum process standard deviation (MPSD) [Go to Page]
Table 11 — Values of fσ for maximum process standard deviation for combined control of double specification limits: σ–method
14.5 Supplementary acceptance constants for qualifying towards reduced inspection [Go to Page]
Table 12 — Supplementary acceptance constants for qualifying towards reduced inspection
15 Preliminary operations
15 Examples [Go to Page]
15.1 General
15.2 Examples for the s-method [Go to Page]
Figure 2 — Example of the use of an acceptance diagram, s–method
Figure 3 — Example of the use of an acceptance diagram, s–method
Figure 4 — Example of the use of an acceptance diagram, s–method
Figure 5 — Example of the use of a standardized acceptance diagram, s–method
Figure 6 — Example of the use of an acceptance diagram, s–method
15.3 Examples for the σ-method [Go to Page]
Figure 8 — Example of the use of an acceptance diagram, σ–method
Figure 9 — Example of the use of an acceptance diagram, σ–method
15.4 Examples for the p*-method
16 Standard procedures for the s-method [Go to Page]
16.1 Obtaining a plan, sampling, and preliminary calculations
16.2 Acceptability criteria for single specification limits
16.3 Graphical method for a single specification limit
Figure 1 — Example of the use of an acceptance chart for a single specification limit, s—method [Go to Page]
16.4 Acceptability criterion for combined control of double specification limits
16.4.1 General
16.4.2 Procedure for sample size 3
16.4.3 Procedure for sample size 4
For sample size 4 under the s–method, proceed as follows. After calculating the sample mean, , and the sample standard deviation, s, find the applicable value of the coefficient f s from Table D.1, D.2, or D.3. Determine the MSSD (i.e. the maximum all... [Go to Page]
16.4.4 Procedure for sample sizes greater than 4
Figure 2 — Example of the use of an acceptance chart for combined control of double specification limits: s-method with actual scales
17 Standard procedures for the σ-method [Go to Page]
17.1 Obtaining a plan, sampling, and preliminary calculations [Go to Page]
Figure 3 — Example of the use of an acceptance chart for combined control of double specification limits: s-method with normalized scales
17.2 Acceptability criteria for a single specification limit
17.3 Acceptability criterion for combined control of double specification limits
18 Procedure during continuing inspection [Go to Page]
19 Normality and outliers [Go to Page]
19.1 Normality [Go to Page]
19.2 Outliers
20 Records [Go to Page]
20.1 Control charts
20.2 Lots that are not accepted
21 Operation of switching rules
22 Discontinuation and resumption of inspection
23 Switching between the s-method and σ-method [Go to Page]
23.1 Estimating the process standard deviation
23.2 State of statistical control
23.3 Switching from the s -method to the σ -method
23.4 Switching from the σ -method to the s -method
24 Charts B to R — Operating characteristic curves and tabulated values for single sampling plans, normal inspection: s-method [Go to Page]
24.1 Operating characteristic curves and tabulated values for sample size code letter B: s-method
24.2 Operating characteristic curves and tabulated values for sample size code letter C: s-method
24.3 Operating characteristic curves and tabulated values for sample size code letter D: s-method
24.15 Operating characteristic curves and tabulated values for sample size code letter R: s-method
25 Charts s-D to s-R — Acceptance curves for combined control of double specification limits: s-method [Go to Page]
Figure 22 — Chart s-F: Acceptance curves for combined control of double specification limits for sample size code letter F under normal and tightened inspection and for sample size code letter H under reduced inspection
Figure 26 — Chart s-K: Acceptance curves for combined control of double specification limits for sample size code letter K under normal and tightened inspection and for sample size code letter M under reduced inspection
Figure 27 — Chart s-L: Acceptance curves for combined control of double specification limits for sample size code letter L under normal and tightened inspection and for sample size code letter N under reduced inspection
Figure 28 — Chart s-M: Acceptance curves for combined control of double specification limits for sample size code letter M under normal and tightened inspection and for sample size code letter P under reduced inspection
Figure 29 — Chart s-N: Acceptance curves for combined control of double specification limits for sample size code letter N under normal and tightened inspection and for sample size code letter Q under reduced inspection
Figure 30 — Chart s-P: Acceptance curves for combined control of double specification limits for sample size code letter P under normal and tightened inspection and for sample size code letter R under reduced inspection
Figure 31 — Chart s-Q: Acceptance curves for combined control of double specification limits for sample size code letter Q under normal and tightened inspection
Annex A
Table for determining the sample size code letter
Annex A
Procedures for obtaining s and σ [Go to Page]
A.1 Procedure for obtaining s [Go to Page]
A.1.1 Definition
A.1.2 One-pass formula
A.1.3 Potential numerical inaccuracy
A.1.4 An updating algorithm for sequential data
A.1.5 Spreadsheets and pocket calculators
A.2 Procedure for obtaining σroot [Go to Page]
A.2.1 Definition
A.2.2 Simplication for equal sample sizes
Annex B
Form k for single sampling plans: s-method [Go to Page]
Table B.1 — Single sampling plans of Form k for normal inspection: s–method
Table B.2 — Single sampling plans of Form k for tightened inspection: s–method
Table B.3 — Single sampling plans of Form k for reduced inspection: s–method
Annex B
Accommodating measurement variability [Go to Page]
B.1 General
B.2 Process standard deviation σ and measurement standard deviation σm are both known
B.3 Process standard deviation σ is unknown but measurement standard deviation σm is known
B.4 Process standard deviation σ and measurement standard deviation σm are both unknown [Go to Page]
Table B.1 — Sample results for the example of B.4
Table B.2 — Sample results with subtraction of 12,9 for the example of B.4
Annex C
Form k for single sampling plans: σ-method [Go to Page]
Table C.1 — Single sampling plans of Form k for normal inspection: σ–method
Table C.2 — Single sampling plans of Form k for tightened inspection: σ–method
Table C.3 — Single sampling plans of Form k for reduced inspection: σ–method
Annex C
Sampling strategies [Go to Page]
Figure C.1 — Examples of different sampling strategies with a two-dimensional population
Annex D
Values of f s for maximum sample standard deviation (MSSD) [Go to Page]
Table D.1 — Values of f s for maximum sample standard deviation for combined control of double specification limits: normal inspection, s–method
Table D.2 — Values of f s for maximum sample standard deviation for combined control of double specification limits: tightened inspection, s–method
Table D.3 — Values of f s for maximum sample standard deviation for combined control of double specification limits: reduced inspection, s–method
Annex D
Operating characteristics for the σ–method [Go to Page]
D.1 Probability of acceptance for the σ-method
D.2 Example
D.3 Comparison with tabulated value for the s–method
Annex E
Values of fσ for maximum process standard deviation (MPSD) [Go to Page]
Table E.1 — Values of f σ for maximum process standard deviation for combined control of double specification limits: σ–method
Annex E
Operating characteristic for the s-method – tabulated values for single sampling plans, normal inspection [Go to Page]
E.1 Probability of acceptance for the s-method
Annex F
Estimating the process fraction nonconforming for sample size 3: s-method
Annex F
Consumer’s risk qualities [Go to Page]
F.1 The consumer’s risk quality for the s-method plans
F.2 Tables for the consumer’s risk qualities for the s–method plans
F.3 The consumer’s risk quality for the σ–method plans
F.4 Tables for the consumer’s risk qualities for the σ–method plans
Annex G
Single sampling plans of Form p*
Annex G
Producer’s risks [Go to Page]
G.1 The producer’s risk for the s-method plans
G.2 Tables for the producer’s risks for the s–method plans
G.3 The producer’s risk for the σ–method plans
G.4 Tables for the producer’s risk for the σ–method plans
Annex H
Values of c U for upper control limit on the sample standard deviation [Go to Page]
Table H.1 — Values of c U for upper control limit on the sample standard deviation
Annex H
Construction of acceptance diagrams for double specification [Go to Page]
H.1 General
H.2 s-method acceptance diagrams for double specification limits under separate control [Go to Page]
Figure H.1 — acceptance region, s-method, separate control
H.3 s-method acceptance diagrams for double specification limits under combined control [Go to Page]
Figure H.2 — acceptance region, s-method, combined control – construction lines and
Figure H.3 — acceptance region, s-method, combined control with construction lines and
H.4 σ-method – determination of combined specification limits acceptance criteria [Go to Page]
Figure H.8 — acceptance region, σ-method, combined control with sample mean and standard deviation
H.5 standardized acceptance diagrams for double specification limits under separate control [Go to Page]
Figure H.10 — standardized acceptance region, s-method, combined control with sample mean and standard deviation
H.6 Spreadsheet implementation
Annex I
Supplementary acceptability constants for qualifying towards reduced inspection [Go to Page]
Table I.1 — Supplementary acceptability constants for qualifying towards reduced inspection
Annex I
Use of the underlying software [Go to Page]
I.1 Execution of the standard [Go to Page]
Table I.1 — Function ISO3951_1
I.2 Operating characteristic functions [Go to Page]
Table I.2 — Function OC
I.3 Confidence intervals [Go to Page]
Table I.3 — Function confint
I.4 Consumer’s risk quality and the producer’s risk
I.5 Constructing the acceptance curve for the case with two specification limits and the s-method
Annex J
Procedures for obtaining s and σ [Go to Page]
J.1 Procedure for obtaining s
J.2 Procedure for obtaining σ
Annex K
Consumer’s risk qualities [Go to Page]
Table K.1 — Consumer’s risk quality (in percent) for normal inspection: s–method
Table K.2 — Consumer’s risk quality (in percent) for normal inspection: σ–method
Table K.3 — Consumer’s risk quality (in percent) for tightened inspection: s–method
Table K.4 — Consumer’s risk quality (in percent) for tightened inspection: σ–method
Table K.5 — Consumer’s risk quality (in percent) for reduced inspection: s–method
Table K.6 — Consumer’s risk quality (in percent) for reduced inspection: σ–method
Annex L
Producer’s risks [Go to Page]
Table L.1 — Producer’s risk (in percent) for normal inspection: s–method
Table L.2 — Producer’s risk (in percent) for normal inspection: σ–method
Table L.3 — Producer’s risk (in percent) for tightened inspection: s–method
Table L.4 — Producer’s risk (in percent) for tightened inspection: σ–method
Table L.5 — Producer’s risk (in percent) for reduced inspection: s–method
Table L.6 — Producer’s risk (in percent) for reduced inspection: σ–method
Annex M
Operating characteristics for the σ-method [Go to Page]
M.1 Formula for probability of acceptance
M.2 Example
M.3 Comparison with tabulated value for the s–method
Annex N
Estimating the process fraction nonconforming for sample sizes 3 and 4: s-method [Go to Page]
N.1 General formula for sample size, n
N.2 Formula for sample size 3
N.3 Formula for sample size 4
Annex O
Accommodating measurement variability [Go to Page]
O.1 General
O.2 Process standard deviation σ and measurement standard deviation σm both known
O.3 Process standard deviation σ unknown but measurement standard deviation σ m known
O.4 Process standard deviation σ and measurement standard deviation σ m both unknown
Bibliography
Bibliography
[25] R Foundation for Statistical Computing [online database]. Available from http://www.R-project.org [viewed 17 September 2020].
Tracked_Changes_Cover_Markup_new.pdf [Go to Page]
compares BS ISO 3951-1:2022 [Go to Page]
TRACKED CHANGES
Text example 1 — indicates added text (in green)
30409816.pdf [Go to Page]
National foreword
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols
5 Choice of a sampling plan [Go to Page]
5.1 Choice between variables and attributes
5.2 General
5.3 Choice between the s-method and σ-method
5.4 Choice of inspection level and AQL
6 Standard procedures for the s-method [Go to Page]
6.1 General
6.2 Single specification limits
6.3 Double specification limits
7 Standard procedures for the σ-method [Go to Page]
7.1 General
7.2 Single specification limits
7.3 Double specification limits
8 The p*-method
9 Switching between inspection severities [Go to Page]
9.1 Rules for switching between inspection severities
9.2 Records for switching between inspection severities
10 Relation to ISO 2859-1 [Go to Page]
10.1 Similarities
10.2 Differences
11 Allowing for measurement uncertainty
12 Normality, data transformations and outliers [Go to Page]
12.1 Normality
12.2 Data transformations
12.3 Outliers
13 Monitoring and recording of inspection results [Go to Page]
13.1 Monitoring of inspection results
13.2 Process capability and performance assessment
13.3 Monitoring of process parameters
14 Tables [Go to Page]
14.1 Form k for single sampling plans: s-method
14.2 Form k for single sampling plans: σ-method
14.3 Form p* single sampling plans
14.4 Values of fσ for maximum process standard deviation (MPSD)
14.5 Supplementary acceptance constants for qualifying towards reduced inspection
15 Examples [Go to Page]
15.1 General
15.2 Examples for the s-method
15.3 Examples for the σ-method
15.4 Examples for the p*-method
Annex A (informative) Procedures for obtaining s and σ
Annex B (informative) Accommodating measurement variability
Annex C (informative) Sampling strategies
Annex D (informative) Operating characteristics for the σ–method
Annex E (informative) Operating characteristic for the s-method – tabulated values for single sampling plans, normal inspection
Annex F (informative) Consumer’s risk qualities
Annex G (informative) Producer’s risks
Annex H (informative) Construction of acceptance diagrams for double specification limits
Annex I (informative) Use of the underlying software
Bibliography [Go to Page]

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BS ISO 3951-1:2022 - TC Tracked Changes. Sampling procedures for inspection by variables - Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL, 2022

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please select your company type below: