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BS ISO 20263:2024 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials >
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BS ISO 20263:2024 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials, 2024
- undefined
- Foreword
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms, definitions and abbreviated terms [Go to Page]
- 4 Specimen preparation for cross-sectional imaging [Go to Page]
- 5 Determination of an interface position [Go to Page]
- 6 Detailed procedure for determining the position of the interface [Go to Page]
- 7 Uncertainty [Go to Page]
- Annex A (informative) Examples of processing the real TEM/STEM images for three image types
- Annex B (informative) Two main applications of the method
- Annex C (informative) Calibration of scale unit: Pixel size calibration
- Bibliography [Go to Page]
