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BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy >
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BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy, 2014
- Section sec_1
- Section sec_2
- Section sec_3
- Section sec_3.1
- Section sec_3.2
- Section sec_3.3
- Section sec_3.4
- Section sec_3.5
- Section sec_3.6
- Section sec_3.7
- Section sec_3.8
- Section sec_4
- Section sec_5
- Section sec_5.1
- Section sec_5.2
- Section sec_5.2.1
- Section sec_5.2.2
- Section sec_5.2.3
- Section sec_5.2.4
- Section sec_5.3
- Section sec_5.3.1
- Section sec_5.3.2
- Section sec_5.3.3
- Section sec_5.3.4
- Section sec_5.3.5
- Section sec_5.3.6
- Section sec_5.4
- Section sec_5.4.1
- Section sec_5.4.2
- Section sec_5.4.3
- Section sec_6
- Section sec_6.1
- Section sec_6.2
- Section sec_6.2.1
- Section sec_6.2.2
- Section sec_6.2.2.1
- Section sec_6.2.2.2
- Table tab_b
- Figure fig_1
- Section sec_6.3
- Section sec_6.3.1
- Section sec_6.3.1.1
- Figure fig_2
- Section sec_6.3.1.2
- Section sec_6.3.1.3
- Section sec_6.3.2
- Section sec_6.3.2.1
- Section sec_6.3.2.2
- Table tab_c
- Figure fig_3
- Section sec_6.3.3
- Section sec_6.3.3.1
- Section sec_6.3.3.2
- Section sec_6.3.3.3
- Section sec_6.4
- Section sec_6.4.1
- Section sec_6.4.2
- Section sec_6.4.3
- Section sec_6.4.4
- Section sec_7
- Annex sec_A
- Table tab_e
- Figure fig_A.1
- Annex sec_B
- Annex sec_C
- Annex sec_C.1
- Annex sec_C.2
- Figure fig_C.1
- Annex sec_C.3
- Annex sec_C.4
- Figure fig_C.2
- Reference ref_1
- Reference ref_2
- Reference ref_3
- Reference ref_4
- Reference ref_5
- Reference ref_6
- Reference ref_7
- Reference ref_8
- Reference ref_9
- Reference ref_10
- Reference ref_11
- Reference ref_12
- Foreword
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Abbreviated terms
- 5 Experimental parameters
- 5.1 General
- 5.2 Parameters related to the primary beam
- 5.3 Parameters related to wavelength dispersive X-ray spectrometers
- 5.4 Parameters related to the specimen
- 6 Procedures and measurements
- 6.1 General
- 6.2 Beam current
- 6.3 Parameters related to measured peaks
- 6.4 Parameters related to the specimen
- 7 Test report
- Annex A (informative) Methods of estimating analysis area
- Annex B (informative) Methods of estimating analysis depth
- Annex C (informative) Method of estimating X-ray analysis volume by applying the Monte Carlo (MC) simulation
- Bibliography [Go to Page]