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eLibrary > BS EN IEC 61869-1:2024 Instrument transformers - General requirements >

BS EN IEC 61869-1:2024 Instrument transformers - General requirements, 2024

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BS EN IEC 61869-1:2024 Instrument transformers - General requirements, 2024

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European foreword
Endorsement notice
Annex ZA (normative) Normative references to international publications with their corresponding European publications [Go to Page]
English [Go to Page]
CONTENTS
FOREWORD
INTRODUCTION
1 Scope
Figures [Go to Page]
Figure 1 – General block diagram of single-phase LPITs
2 Normative references
3 Terms, definitions, symbols and abbreviated terms [Go to Page]
3.1 Terms and definitions
3.2 Symbols and abbreviated terms
4 Normal and special environmental conditions [Go to Page]
4.1 General
4.2 Normal environmental conditions [Go to Page]
4.2.1 Ambient air temperature
4.2.2 Altitude
4.2.3 Vibrations or earth tremors
4.2.4 Exposure to pollution
4.2.5 Other environmental conditions for indoor instrument transformers
Tables [Go to Page]
Table 1 – Operating ambient temperature categories [Go to Page]
4.2.6 Other environmental conditions for outdoor instrument transformers
4.2.7 IT with outdoor parts
4.3 Special environmental conditions [Go to Page]
4.3.1 General
4.3.2 Altitude
4.3.3 Ambient temperature
4.3.4 Vibrations or earth tremors
4.3.5 Earthquakes
5 Ratings [Go to Page]
5.1 General
5.2 Voltage ratings [Go to Page]
5.2.1 Highest voltage for equipment (Um)
Table 2 – Rated primary terminal insulation levels for instrumenttransformers for AC applications [Go to Page]
5.2.2 Power system earthing
5.2.3 Standard values for rated primary voltage (Upr)
5.2.4 Standard values for rated secondary voltage (Usr)
5.2.5 Rated auxiliary power supply voltage (Uar)
5.3 Current ratings [Go to Page]
5.3.1 Standard values for rated primary current (Ipr)
5.3.2 Standard values for rated secondary current (Isr)
5.3.3 Standard values for rated continuous thermal current (Icth)
5.3.4 Short-time current ratings
Table 3 – Insulation requirements for power supply terminals
5.4 Dielectric ratings [Go to Page]
5.4.1 General
5.4.2 Rated primary terminal insulation level
5.4.3 Other requirements for primary terminal insulation
Table 4 – Partial discharge test voltages and permissible levels for AC applications [Go to Page]
5.4.4 Between-section insulation requirements
5.4.5 Insulation requirements for secondary terminals and low-voltage components
Table 5 – Maximum values of tanδ
Table 6 – LPIT secondary terminal and low-voltagecomponent terminal withstand capability
5.5 Rated frequency (fr)
5.6 Output ratings [Go to Page]
5.6.1 Rated output for inductive instrument transformers and CVTs
5.6.2 Rated burden for LPITs
5.6.3 Standard values for the rated delay time for EITs (tdr)
5.7 Accuracy requirements [Go to Page]
5.7.1 General
5.7.2 Rated accuracy classes
5.7.3 Accuracy class extension for harmonics
5.7.4 Accuracy requirements for harmonics
Table 7 – WB0 extension for harmonics
Table 8 – Accuracy class extensions for wide bandwidth applications [Go to Page]
5.7.5 Harmonic requirements for LPIT protection accuracy classes
5.7.6 Anti-aliasing filter for EIT using digital data processing
Figure 2 – Example of digital data acquisition system
Table 9 – Harmonic requirements for protection accuracy classes
Table 10 – Anti-aliasing filter requirements
6 Design and construction [Go to Page]
6.1 Requirements for liquids used in equipment [Go to Page]
6.1.1 General
6.1.2 Liquid quality
Figure 3 – Example of frequency response mask for EIT with digital output [Go to Page]
6.1.3 Liquid level indicator
6.1.4 Liquid tightness
6.2 Requirements for gases used in equipment [Go to Page]
6.2.1 General
6.2.2 Gas quality
6.2.3 Gas monitoring device
6.2.4 Gas tightness
6.2.5 Pressure-relief device
6.3 Requirements for solid materials used in equipment
6.4 Requirements for temperature rise of parts and components [Go to Page]
6.4.1 General
Table 11 – Permissible temporary leakage rates for gas systems
Table 12 – Limits of temperature and temperature rise for various parts,materials and dielectrics of instrument transformers [Go to Page]
6.4.2 Influence of altitude on temperature rise
Figure 4 – Altitude correction factor for the temperature rise
6.5 Requirements for earthing of equipment [Go to Page]
6.5.1 General
6.5.2 Earthing of the enclosure
6.5.3 Electrical continuity
6.6 Requirements for the external insulation [Go to Page]
6.6.1 Pollution
6.6.2 Altitude
Table 13 – Specific creepage distances by site pollution severity class, as defined in the former publication
6.7 Mechanical requirements
Figure 5 – Factor m for the switching impulse voltage (USIL) withstand test
6.8 Multiple chopped impulses on primary terminals
Table 14 – Maximum static withstand loads
Table 15 – Maximum gas-in-oil level in instrument transformers
6.9 Internal arc fault protection requirements
6.10 Degrees of protection by enclosures [Go to Page]
6.10.1 General
6.10.2 Protection against access to hazardous parts and protection of the equipment against ingress of solid foreign objects and water
Table 16 – Arc fault duration and performance criteria [Go to Page]
6.10.3 Protection of enclosure against mechanical impact under normal operating conditions
6.11 Electromagnetic compatibility (EMC) [Go to Page]
6.11.1 General
6.11.2 Requirements for immunity
Table 17 – Immunity requirements and test levels
Figure 6 – Example structure used in HV AIS applications subjected to EMC tests
Figure 7 – Example of structure used in HV GIS applications subjected to EMC tests
Table 18 – Acceptance criteria for EMC immunity tests [Go to Page]
6.11.3 Requirements for emission
6.11.4 Requirements for transmitted overvoltage (TOV)
6.11.5 Requirements for radio interference voltage (RIV)
6.12 Corrosion
6.13 Markings [Go to Page]
6.13.1 General
6.13.2 Terminal markings
6.13.3 Rating plate markings
6.14 Requirements for LPIT secondary terminal connection [Go to Page]
6.14.1 Requirements for digital output connection
6.14.2 Requirements for analogue output connections
Figure 8 – Duplex LC connector
6.15 EIT secondary signal noise
Table 19 – Connectors
6.16 Fire hazard
6.17 Pressure withstand of gas-filled enclosures
6.18 Failure detection of EIT
6.19 Operability
6.20 Reliability and dependability of electronic part of EIT
6.21 Vibration requirements
6.22 Storage climatic conditions withstand capability
7 Tests [Go to Page]
7.1 General [Go to Page]
7.1.1 Classification of tests
7.1.2 List of tests
Table 20 – List of tests [Go to Page]
7.1.3 Sequence of tests
Table 21 – Gas type and pressure during tests
Table 22 – Required routine tests [Go to Page]
7.1.4 Testing conditions
7.2 Type tests [Go to Page]
7.2.1 General
7.2.2 Temperature rise test
7.2.3 Impulse voltage withstand test on primary terminals
7.2.4 Wet test for outdoor type instrument transformers
7.2.5 Electromagnetic compatibility (EMC) tests
Figure 9 – RIV measuring circuit [Go to Page]
7.2.6 Tests for accuracy
Figure 10 – Temperature cycle accuracy test [Go to Page]
7.2.7 Verification of the degree of protection by enclosures
7.2.8 Enclosure tightness test at ambient temperature
7.2.9 Proof test for the gas-filled enclosure
7.2.10 Mechanical tests
7.2.11 Voltage withstand test of low-voltage components and secondary terminals
Table 23 – Modalities of application of the test loadsto be applied to the primary terminals [Go to Page]
7.2.12 Storage climatic environmental tests
Table 24 – Dry heat test, storage temperature
Table 25 – Cold test, storage temperature [Go to Page]
7.2.13 Vibration test
Table 26 – Damp heat steady state test [Go to Page]
7.2.14 Durability of markings
7.2.15 Tests for accuracy for harmonics
7.2.16 Test for anti-aliasing
7.3 Routine tests [Go to Page]
7.3.1 Power-frequency voltage withstand test on primary terminals
7.3.2 Partial discharge measurement
Figure 11 – Test circuit for partial discharge measurement
Figure 12 – Alternative circuit for partial discharge measurement
Figure 13 – Example of balanced test circuit for partial discharge measurement [Go to Page]
7.3.3 Power-frequency voltage withstand tests between sections
Figure 14 – Voltage profile for partial discharge measurement [Go to Page]
7.3.4 Power-frequency voltage withstand tests on secondary terminals
7.3.5 Power-frequency voltage withstand test for low-voltage components
7.3.6 Test for accuracy
7.3.7 Verification of markings
7.3.8 Enclosure tightness test at ambient temperature
7.3.9 Pressure test for the gas-filled enclosure
7.3.10 Measurement of capacitance and dielectric dissipation factor
7.4 Special tests [Go to Page]
7.4.1 Multiple chopped impulse test on primary terminals
7.4.2 Transmitted overvoltage test
Figure 15 – Transmitted overvoltage measurement: test impulse waveforms
Table 27 – Transmitted overvoltage limits
Figure 16 – Transmitted overvoltage measurement:primary test configuration for AIS equipment
Figure 17 – Transmitted overvoltage measurement:primary test configuration for GISs (CTs and VTs)
Figure 18 – Transmitted overvoltage measurement:example of correct secondary test connection for CT and VT [Go to Page]
7.4.3 Internal arc fault test
Figure 19 – Typical configuration for internal arc fault test [Go to Page]
7.4.4 Enclosure tightness test at low and high temperatures
7.4.5 Insulation resistance measurement on secondary terminals
7.4.6 Corrosion test
7.4.7 Fire hazard test
7.4.8 Thermo-mechanical endurance test
7.4.9 Vibration and shock tests
Table 28 – Shock severity levels [Go to Page]
7.4.10 Tests for accuracy versus harmonics
7.4.11 Seismic qualification
7.5 Commissioning tests [Go to Page]
7.5.1 General
7.5.2 Final installation inspection and tests
7.5.3 Gas dew point test
7.6 Sample tests
8 Rules for transport, storage, erection, operation and maintenance [Go to Page]
8.1 General
8.2 Conditions during transport, storage and installation
8.3 Installation [Go to Page]
8.3.1 General
8.3.2 Unpacking and lifting
8.3.3 Assembly
8.3.4 Mounting
8.3.5 Connections
8.3.6 Final installation inspection and tests
8.4 Operation
8.5 Maintenance [Go to Page]
8.5.1 General
8.5.2 Responsibilities for the manufacturer
8.5.3 Responsibilities for the user
8.6 Failure report
9 Safety
10 Influence of products on the natural environment
Annex A (normative)Identification of test specimen [Go to Page]
A.1 General
A.2 Data
A.3 Drawings
Table A.1 – Example of drawing to be submitted
Annex B (informative) Recommendation for contents of failure reports [Go to Page]
B.1 General
B.2 Content
Annex C (informative)Fire hazard [Go to Page]
C.1 Fire hazard
C.2 Fire hazard test
Table C.1 – Fire hazard of electrotechnical products
Annex D (informative)Sample test [Go to Page]
D.1 Sample test definition
D.2 Sample tests
Annex E (informative)Technique used in temperature rise test of transformers to determinethe thermal time constant by an experimental estimation [Go to Page]
Figure E.1 – Graphical extrapolation to ultimate temperature rise
Annex F (informative)Guidance for the extension of validity of type testsor special tests of instrument transformers [Go to Page]
F.1 General
F.2 Information needed for extension of type test validity
F.3 Application of extension criteria [Go to Page]
F.3.1 Dielectric tests
F.3.2 Temperature rise tests
Table F.1 – Extension criteria for dielectric withstand performance [Go to Page]
F.3.3 Short-time and dynamic withstand current tests (current transformers)
Table F.2 – Extension criteria for temperature rise performance
Table F.3 – Extension criteria for short-time and dynamic withstand current performance [Go to Page]
F.3.4 Internal arc fault tests
F.3.5 Multiple chopped impulse test
Table F.4 – Extension criteria for internal arc fault tests
Table F.5 – Extension criteria for multiple chopped impulse test
Annex G (informative)Guidance for the calculation of equivalent diameterin case of irregular shape of insulating part [Go to Page]
G.1 General
G.2 Current transformers and earthed voltage transformers
Figure G.1 – Shed dimensions
G.3 Unearthed voltage transformers
Figure G.2 – Examples of MV CTs and earthed VTs
Figure G.3 – Example of a CT with multiple insulator areas
Figure G.4 – Examples of unearthed VTs
Figure G.5 – Example of a VT with multiple insulator areas
Annex H (informative)Test circuits [Go to Page]
H.1 Test circuits for accuracy measurements in steady state for current transformers with analogue secondary signal
Figure H.1 – Test circuit for accuracy measurements of inductive CTs
Figure H.2 – Test circuit for analogue accuracy measurements of LPCTs
Figure H.3 – Test circuit for analogue accuracy measurements of LPCTs(alternative solution)
Figure H.4 – Test circuit for digital accuracy measurements of LPCTs
H.2 Test circuits for accuracy measurements in steady state for voltage transformers with analogue secondary signal
Figure H.5 – Test circuit for accuracy measurements of inductive VTs or CVTs
Figure H.6 – Test circuit for analogue accuracy measurements of LPVTs
Figure H.7 – Test circuit for analogue accuracy measurements of LPVTs(alternative solution)
Figure H.8 – Test circuit for digital accuracy measurements of LPVTs
Annex I (normative)Seismic qualification of instrument transformers [Go to Page]
I.1 Scope
I.2 Seismic conditions [Go to Page]
I.2.1 Time-history
I.2.2 Seismic severity of application
Figure I.1 – Record of time-history in real (3 dimensional)
Figure I.2 – Required response spectrum
Table I.1 – Seismic severity levels [Go to Page]
I.2.3 Superelevation factor (kse)
I.3 Seismic qualification information [Go to Page]
I.3.1 Qualification options
I.3.2 General information provided by purchaser
I.4 Qualification procedure [Go to Page]
I.4.1 General
I.4.2 Qualification by static calculation or dynamic analysis
Figure I.3 – Flowchart of qualification procedure
Figure I.4 – Measured deflection in free oscillation
Figure I.5 – Sketch of the parameters in static calculation [Go to Page]
I.4.3 Qualification by test
Table I.2 – External mass to simulate external forces
I.5 Validity of qualification
Table I.3 – Comparable seismic levels
Bibliography [Go to Page]

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BS EN IEC 61869-1:2024 Instrument transformers - General requirements, 2024

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