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BS EN IEC 61124:2023 Reliability testing. Compliance tests for constant failure rate and constant failure intensity, 2023
- undefined
- Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
- Blank Page [Go to Page]
- English [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms, definitions, abbreviated terms and symbols [Go to Page]
- 3.1 Terms and definitions
- 3.2 Abbreviated terms and symbols [Go to Page]
- 3.2.1 Abbreviated terms
- 3.2.2 Symbols
- 4 General requirements and area of application [Go to Page]
- 4.1 Requirements and characteristics
- 4.2 Applicability to replaced and repaired items
- 4.3 Types of test plans [Go to Page]
- 4.3.1 General
- 4.3.2 Advantages and disadvantages of the different test plan types
- Tables [Go to Page]
- Table 1 – Advantages and disadvantages for the different test plan types
- 5 General test procedure [Go to Page]
- 5.1 Test conditions
- Figures [Go to Page]
- Figure 1 – Relative ETT (Te*/m0) and MaxTT (Tt*/m0) of various tests with the same risks
- 5.2 General characteristics of the test plans
- 5.3 Data to be recorded
- 5.4 Calculation of accumulated test time, T*
- 5.5 Number of failures
- 6 Truncated sequential probability ratio test (SPRT) plans [Go to Page]
- 6.1 General
- 6.2 Common test procedure
- 6.3 Decision criteria
- 6.4 Operating characteristic (OC) curve
- Figure 2 – SPRT diagram and test example
- Table 2 – OC curve
- 6.5 Expected accumulated test time to decision (ETT)
- Figure 3 – OC curve, Pa
- Table 3 – Relative ETT versus m/m0
- 6.6 Overview of test plans
- Figure 4 – SPRT – Curve of expected accumulated test time to decision (ETT)
- Table 4 – Overview of type A SPRT plans
- 7 Fixed time/failure terminated test plans – Fixed duration (to acceptance) test plans [Go to Page]
- 7.1 General
- Table 5 – Overview of type C SPRT plans
- 7.2 Common test procedure
- 7.3 Decision criteria
- 7.4 Test plans
- 8 Design of alternative time/failure terminated test plans (FTFT) [Go to Page]
- 8.1 General
- 8.2 Design procedures
- Table 6 – Type B FTFT plans
- 8.3 Common FTFT procedure
- 8.4 Decision criteria
- 9 Calendar time/failure terminated test plans (FTFT) for non-replaced items [Go to Page]
- 9.1 General
- 9.2 Common test procedure
- 9.3 Decision criteria
- 9.4 Use of IEC 61123:2019, Table 5 for fixed calendar time tests [Go to Page]
- 9.4.1 General
- 9.4.2 Procedure when the test time is given
- 9.4.3 Procedure when the number of items is given
- 10 Combined test plans [Go to Page]
- 10.1 General
- 10.2 Common test procedure
- 10.3 Decision criteria
- 10.4 Test plans
- Figure 5 – Example of a decision graph for combinedtest plan (type D) and for SPRT type C
- 11 Performing the test and presenting the results [Go to Page]
- Table 7 – Overview of type D combined plans
- Annex A (normative)Tables for border lines of SPRT plans (types A and C) [Go to Page]
- A.1 Symbols
- A.2 Border lines
- Figure A.1 – Decision graph of SPRT plan
- Table A.1 – Constants for border line formulae and their coordinatesfor type A SPRT plans
- Table A.2 – Constants for border line formulae and their coordinatesfor type C SPRT plans
- A.3 Example of the SPRT plan from Clause 6
- Table A.3 – Example for SPRT using test plan A.41 (with example data)
- Annex B (normative)Tables and graphs for combined test plans (type D) [Go to Page]
- B.1 General
- Table B.1 – Combined test plans in Annex B
- Table B.2 – Type D test plans – Accept and reject lines
- B.2 Test plans D.3 and C.3 (α = β = 10 %, D = 1,7)
- Table B.3 – Expected accumulated test time to acceptance decision,Te*(+), for D and C test plans
- Table B.4 – Accept and reject lines for D.3 and C.3 test plans
- Figure B.1 – Expected accumulated test time to acceptance decision,Te*(+) for D.3 and C.3 test plans
- Figure B.2 – Operating characteristic Pa for D.3 and C.3 test plans
- Annex C (informative)Extension of the set of SPRTs type A [Go to Page]
- C.1 Symbols
- C.2 Extension of the set of type A tests (through interpolation by α and β )
- Table C.1 – Example for interpolation by α and β
- Annex D (informative)Approximation of operating characteristic fortype A SPRTs by Wald's formula [Go to Page]
- D.1 Symbols
- D.2 Approximations of OC in this document
- D.3 Approximation of OC for type A SPRT by Wald's formula
- Figure D.1 – Approximation of OC for type A SPRT using Wald's formula
- D.4 Construction of the approximated OC curve using a spreadsheet
- Table D.1 – Spreadsheet set-up for construction of the OC curve by Wald
- Table D.2 – Formulae embedded in the spreadsheet
- Annex E (informative)Mathematical references and examples forfixed time/failure terminated test (FTFT) plans [Go to Page]
- E.1 Symbols
- E.2 Mathematical references [Go to Page]
- E.2.1 General
- E.2.2 Mathematical references
- E.2.3 Design procedure {a}
- Table E.1 – List of the typical FTFT design procedures [Go to Page]
- E.2.4 Design procedure {b}
- E.2.5 Design procedure {c}
- E.2.6 Design procedure {d}
- E.3 Examples of FTFT design using test plans B [Go to Page]
- E.3.1 Example 1
- E.3.2 Example 2
- Figure E.1 – Example 1 – Expected accumulated test timeto decision (ETT) of tests B.2 and A.25
- E.4 Test OC approximation using formula for FTFT
- Figure E.2 – Example 1 – Operating characteristic of tests B.2 and A.25
- Annex F (informative)Examples of FTFT design using a spreadsheet program [Go to Page]
- F.1 General
- Table F.1 – Set-up of the spreadsheet with embedded formulae
- F.2 Finding the test border lines using optimization on the example of the design procedure {b}
- Table F.2 – Formulae embedded in the spreadsheet
- Table F.3 – Fragment from Table 6
- F.3 ETT and OC curves
- Figure F.1 – Using Solver to find Tt*/m0 –Accumulated test truncation time in terms of m0
- Figure F.2 – ETT plotted from the spreadsheet calculations
- Figure F.3 – OC curve plotted from the spreadsheet calculations
- F.4 Example of FTFT design by procedure {a}
- Table F.4 – Set-up 1 of the spreadsheet for example by procedure {a}
- Figure F.4 – Using Solver to find Tt*/m0 and c in Step {a1}
- Table F.5 – Set-up 2 of the spreadsheet for example by procedure {a}
- F.5 Example of FTFT design by procedure {c}
- Figure F.5 – Using Solver to find Tt*/m0 in Step {a2}
- Table F.6 – Set-up 3 (final solution) for example by procedure {a}
- Table F.7 – Set-up 2 for example by procedure {c}
- F.6 Example of FTFT design by procedure {d}
- Figure F.6 – Using Solver to find Tt*/m0 in Step {c2}
- Table F.8 – Set-up 3 (final solution) for example by procedure {c}
- Table F.9 – Set-up 1 of the spreadsheet for example by procedure {d}
- Figure F.7 – Using Solver to find D and c in Step {d1}
- Table F.10 – Set-up 2 of the spreadsheet for example by procedure {d}
- F.7 Example of a test with replacement of failed items
- Figure F.8 – Using Solver to find D and Tt* in Step {d2}
- Table F.11 – Set-up 3 (final solution) for example by procedure {d}
- F.8 Evaluation of an approximate OC for non-FTFT plans using a spreadsheet
- Table F.12 – Set-up of the spreadsheet with embedded formulae from Clause F.8
- Figure F.9 – Using Solver to find c and Tt*/m0 from Clause F.8
- Table F.13 – Set-up 1 of the spreadsheet from Clause F.8
- Table F.14 – Set-up 2 of the spreadsheet for example from Clause F.8
- Figure F.10 – OC approximated by formula for FTFT (example from Clause F.8)
- Annex G (informative)Examples and mathematical references forthe calendar time terminated test plans [Go to Page]
- G.1 Examples [Go to Page]
- G.1.1 Example 1
- G.1.2 Example 2
- G.2 Mathematical background
- Annex H (informative)Derivation and mathematical reference for the optimized test plansof GOST R 27 402 [12] [Go to Page]
- H.1 Symbols
- H.2 Test plan types and terminology
- H.3 Introductory remarks
- Figure H.1 – Test plan types and terminology
- H.4 Procedure used for developing the optimized test plans
- Figure H.2 – Principle of test plans
- Figure H.3 – Partitioning of the test plan graph
- Figure H.4 – Interior nodes and border nodes
- Figure H.5 – Paths to the accept line
- Figure H.6 – Paths to the reject line
- Figure H.7 – Probabilities of paths transfer between nodes
- Figure H.8 – Recurrent element – Two cases
- Bibliography [Go to Page]