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BS EN IEC 61000-4-20:2022 - TC Tracked Changes. Electromagnetic compatibility (EMC) - Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides, 2022
- 30455902
- A-30350430 [Go to Page]
- undefined
- Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
- Blank Page [Go to Page]
- English [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms, definitions and abbreviated terms [Go to Page]
- 3.1 Terms and definitions
- 3.2 Abbreviated terms
- 4 General
- 5 TEM waveguide requirements [Go to Page]
- 5.1 General
- 5.2 General requirements for the use of TEM waveguides [Go to Page]
- 5.2.1 Test volume and maximum EUT size
- 5.2.2 Validation of usable test volume
- Tables [Go to Page]
- Table 1 – Values k for expanded uncertainty with normal distribution
- 5.3 Special requirements and recommendations for certain types of TEM waveguides [Go to Page]
- 5.3.1 Set-up of open TEM waveguides
- 5.3.2 Alternative TEM mode verification for a two-port TEM waveguide
- 5.3.3 TEM mode generation for a four-port TEM waveguide
- 5.4 Figures for Clause 5
- Figures [Go to Page]
- Figure 1 – Flowchart of TEM mode and field uniformity verification procedurewith the “constant forward power” method (see 5.2.2.4.1)
- Figure 2 – Flowchart of TEM mode and field uniformity verification procedurewith the “constant field strength” method (see 5.2.2.4.2)
- 6 Overview of EUT types [Go to Page]
- 6.1 General
- 6.2 Small EUT
- 6.3 Large EUT
- 7 Laboratory test conditions [Go to Page]
- 7.1 General
- 7.2 Climatic conditions
- 7.3 Electromagnetic conditions
- 8 Evaluation and reporting of test results
- Annex A (normative)Emission measurements in TEM waveguides [Go to Page]
- A.1 Overview
- A.2 Test equipment
- A.3 Correlating TEM waveguide voltages to electric field strength data [Go to Page]
- A.3.1 General
- A.3.2 Correlation algorithms
- A.4 Emission measurement correction factors [Go to Page]
- A.4.1 Reference emission sources
- A.4.2 Arrangement of small EUTs
- A.4.3 Calculation of the small EUT correction factor
- A.5 Emission measurement procedures in TEM waveguides [Go to Page]
- A.5.1 EUT types
- A.5.2 EUT arrangement
- A.6 Test report
- A.7 Figures for Annex A
- Figure A.1 – Routing the exit cable to the corner at the ortho-angleand the lower edge of the test volume in a TEM waveguide (see A.5.2)
- Figure A.2 – Basic ortho-axis EUT positioner or manipulator(see 3.1.13, A.4.2, A.5.1.2, A.5.2)
- Figure A.3 – Die pattern and axis alignment for an EUT [26] (see A.3.2.3.2)
- Figure A.4 – Non-redundant twelve-face and axis orientationsfor a typical EUT [26] (see A.3.2.3.2)
- Figure A.5 – Open-area test site (OATS) emission measurements geometry (see A.3.2.4)
- Annex B (normative)Immunity testing in TEM waveguides [Go to Page]
- B.1 Overview
- B.2 Test equipment [Go to Page]
- B.2.1 General
- B.2.2 Description of the test facility
- B.3 Field uniformity area calibration
- B.4 Test levels
- B.5 Test set-up [Go to Page]
- B.5.1 Arrangement of table-top equipment
- Table B.1 – Uniform area calibration points
- Table B.2 – Test levels [Go to Page]
- B.5.2 Arrangement of floor-standing equipment
- B.5.3 Arrangement of wiring
- B.6 Test procedures
- B.7 Test results and test report
- B.8 Figures for Annex B
- Figure B.1 – Example of test set-up for single-polarization TEM waveguide(see Clause B.5)
- Figure B.2 – Uniform area calibration points in a TEM waveguide (see Clause B.3)
- Annex C (normative)HEMP transient testing in TEM waveguides [Go to Page]
- C.1 Overview
- C.2 Immunity tests [Go to Page]
- C.2.1 General
- C.2.2 Radiated test facilities
- Table C.1 – Radiated immunity test levels definedfor this document [Go to Page]
- C.2.3 Frequency domain spectrum requirements
- C.3 Test equipment
- C.4 Test set-up
- C.5 Test procedure [Go to Page]
- C.5.1 General
- C.5.2 Severity level and test exposures
- C.5.3 Test procedure
- C.5.4 Test execution
- C.5.5 Execution of the radiated immunity test
- C.6 Figure for Annex C
- Figure C.1 – Pulse waveform frequency domain spectral magnitudebetween 100 kHz and 300 MHz (see C.2.1)
- Annex D (informative)TEM waveguide characterization [Go to Page]
- D.1 Overview
- D.2 Distinction between wave impedance and characteristic impedance
- D.3 TEM wave [Go to Page]
- D.3.1 General
- D.3.2 Free-space TEM mode
- D.3.3 Waveguides
- D.4 Wave propagation [Go to Page]
- D.4.1 General
- D.4.2 Spherical propagation
- D.4.3 Plane wave propagation in free space
- D.4.4 Velocity of propagation
- D.5 Polarization
- D.6 Types of TEM waveguides [Go to Page]
- D.6.1 General
- D.6.2 Open TEM waveguides (striplines, etc.)
- D.6.3 Closed TEM waveguides (TEM cells)
- D.7 Frequency limitations
- D.8 Figures for Annex D
- Figure D.1 – Simple waveguide (no TEM mode) (see D.3.3)
- Figure D.2 – Example of waveguides supporting TEM-mode propagation (see D.3.3)
- Figure D.3 – E-field polarization vector (see Clause D.5)
- Figure D.4 – Simple transmission line model for TEM mode propagation (see D.6.1)
- Figure D.5 – One- and two-port TEM waveguide concepts (see D.6.1)
- Figure D.6 – Operation of four-port TEM waveguides (see D.6.1)
- Figure D.7 – Two-port TEM cell (symmetric septum) (see D.6.1 and D.6.3)
- Figure D.8 – One-port TEM cell (asymmetric septum) (see D.6.1 and D.6.3)
- Figure D.9 – Stripline (two plates) (see D.6.1 and D.6.2)
- Figure D.10 – Stripline (four plates, balanced feed) (see D.6.1)
- Figure D.11 – Four-port TEM waveguide (symmetric parallel septa) (see D.6.1 and D.6.3)
- Annex E (informative)Calibration method for E-field probes in TEM waveguides [Go to Page]
- E.1 Overview
- E.2 Probe calibration requirements [Go to Page]
- E.2.1 General
- E.2.2 Calibration frequency range
- E.2.3 Calibration volume
- E.2.4 Probe dimensions
- E.2.5 Perturbations of TEM waveguide fields due to the probe
- E.2.6 Frequency steps
- E.2.7 Field strength
- E.3 Requirements for calibration instrumentation [Go to Page]
- E.3.1 Specifications of TEM waveguide
- Table E.1 – Calibration frequencies
- Table E.2 – Calibration field strength level [Go to Page]
- E.3.2 Harmonics and spurious signals
- E.3.3 Probe fixture
- E.3.4 Measuring net power to a transmitting device using directional couplers
- E.4 E-field probe calibration [Go to Page]
- E.4.1 Calibration methods
- E.4.2 Calibration procedure using a two-port TEM waveguide
- E.4.3 Calibration procedure using one-port TEM waveguide
- E.5 Figures for Annex E
- Figure E.1 – Example of test points for calibration volume validation (see E.2.3)
- Figure E.2 – Set-up for validation of probe perturbation (see E.2.5)
- Figure E.3 – Set-up for measuring net power toa transmitting device (not to scale) (see E.3.4)
- Figure E.4 – Example set-up for E-field probecalibration with two-port TEM waveguide (see E.4.2)
- Figure E.5 – Example set-up for E-field probe calibration withone-port TEM waveguide and alternative method (see E.4.3.2)
- Figure E.6 – Equivalent circuit of monopole antennaand measuring apparatus (see E.4.3.3)
- Annex F (informative)Instrumentation uncertainty of emission measurement results [Go to Page]
- F.1 Radiated disturbance measurements using a TEM waveguide [Go to Page]
- F.1.1 Measurand for radiated disturbance measurements using a TEM waveguide
- F.1.2 Symbols of input quantities common to all disturbance measurements
- F.1.3 Symbols of input quantities specific to TEM waveguide measurements
- F.2 Input quantities to be considered for radiated disturbance measurements using a TEM waveguide
- F.3 Uncertainty budget and rationale for the input quantities for radiated disturbance measurements using a TEM waveguide [Go to Page]
- F.3.1 Uncertainty budget for radiated disturbance measurements using a TEM waveguide
- Table F.1 – Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 30 MHz to 1 000 MHz (example) [Go to Page]
- F.3.2 Rationale for the estimates of input quantities for radiated disturbance measurements using a TEM waveguide
- Table F.2 – Uncertainty budget for radiated disturbance measurement resultsusing a TEM waveguide from 1 GHz to 6 GHz (example)
- Table F.3 – Values of Slim for 30 MHz to 1 000 MHz
- Table F.4 – Values of Slim for 1 GHz to 6 GHz
- F.4 Figures for Annex F
- Figure F.1 – Deviation of the QP detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100 Hz
- Figure F.2 – Deviation of the peak detector level indication from the signal level at receiver input for two cases, a sine-wave signal and an impulsive signal with a pulse repetition frequency of 100 Hz
- Annex G (informative)Measurement uncertainty of immunity testingdue to test instrumentation [Go to Page]
- G.1 General symbols
- G.2 Symbol and definition of the measurand
- G.3 Symbols for input quantities
- G.4 Example: Uncertainty budget for immunity test
- G.5 Rationale for the estimates of input quantities
- Table G.1 – Example uncertainty budget of the immunity test level
- Annex H (informative)Correlation of emission and immunity limitsbetween EMC test facilities [Go to Page]
- H.1 Overview
- H.2 Dipole in free space (representing FAR set-up)
- H.3 Dipole in half space (representing OATS or SAC set-up)
- H.4 Dipole in a TEM-mode transmission line
- H.5 Dipole in a reverberation chamber
- H.6 Correlation
- H.7 Example of emission limits
- Table H.1 – Summary of the emission correlation parameters
- H.8 Figures for Annex H
- Figure H.1 – Representation of a short centre-fed dipole anda more general source representing an EUT (see Clause H.2)
- Figure H.2 – Vertical source and receiving dipoles located overa perfectly-conducting ground plane of infinite extent (see Clause H.3)
- Figure H.3 – Two types of TEM cells with a vertically polarized dipole sourceand the source to receive port geometry defined (see Clause H.4)
- Figure H.4 – Reverberation chamber with a source dipole, a stirrer torandomize the fields, and a general receive antenna (see Clause H.5)
- Figure H.5 – TEM waveguide Class A and Class B emission limits correlatedfrom CISPR 32 [68] (see Clause H.7)
- Annex I (informative)TEM waveguide transient characterization [Go to Page]
- I.1 Overview
- I.2 Test equipment
- I.3 Test set-up
- I.4 TEM waveguide characterization by correlation
- I.5 Quantification of the Pcc
- I.6 Performable transient test signals
- I.7 Figures for Annex I
- Figure I.1 – Test set-up
- Figure I.2 – Signal windowing
- Figure I.3 – Example of a heatmap – Pcc for a test point in the uniform area
- Bibliography [Go to Page]
