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BS EN 61000-3-3:2013+A1:2019 - TC Tracked Changes. Electromagnetic compatibility (EMC) - Limits. Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and n, 2019
- BS EN 61000-3-3:2013+A1:2019 [Go to Page]
- Compliance with a British Standard cannot confer immunity from legal obligations.
- Amendments/corrigenda issued since publication
- August 2019
- Compatibilité électromagnétique (CEM) - Partie 3-3: Limites - Limitation des variations de tension, des fluctuations de tension et du papillotement dans les réseaux publics d'alimentation basse tension, pour les matériels ayant un courant assigné ≤ 16...
- Foreword
- Endorsement notice
- Endorsement notice
- Annex ZZA [Go to Page]
- (informative)
- Table ZZA.1 – Correspondence between this European standard and the Essential Requirements set out in Directive 2014/30/EU [2014 OJ L96]
- Table ZZB.1 – Correspondence between this European standard and the Essential Requirements set out in Directive 2014/53/EU [2014 OJ L153] [Go to Page]
- INTERNATIONAL ELECTROTECHNICAL COMMISSION
- INTRODUCTION
- ELECTROMAGNETIC COMPATIBILITY (EMC) – [Go to Page]
- 1 Scope
- 2 Normative references
- 3 Terms and definitions [Go to Page]
- 3.1
- 3.2 [Go to Page]
- d(t)
- 3.3
- 3.4
- 3.5
- 3.6
- 3.7
- 3.8
- 3.9
- 3.10
- 3.11 [Go to Page]
- F
- 3.12
- 3.13
- 4 Assessment of voltage changes, voltage fluctuations and flicker
- 4.1 Assessment of a relative voltage change, d(t)
- 4.2 Assessment of the short-term flicker value, Pst
- 4.2.1 General
- Table 1 – Assessment method
- 4.2.2 Flickermeter
- 4.2.3 Simulation method
- 4.2.4 Analytical method
- 4.2.4.2 Description of the analytical method
- 4.2.4.3 Shape factor
- 4.2.5 Use of Pst = 1 curve
- 4.3 Assessment of long-term flicker value, Plt
- 5 Limits
- 6 Test conditions [Go to Page]
- 6.1 General
- 6.2 Measurement uncertainty
- 6.3 Test supply voltage
- 6.4 Reference impedance
- 6.5 Observation period
- 6.6 General test conditions
- Figure 1 – Reference network for single-phase and three-phase supplies derived from a three-phase, four-wire supply
- Figure 2 – Curve for Pst = 1 for rectangular equidistant voltage changes
- Figure 3 – Shape factors F for double-step and ramp-voltage characteristics
- Figure 4 – Shape factors F for rectangular and triangular voltage characteristics
- Figure 5 – Shape factor F for motor-start voltage characteristics having various front times
- Annex A [Go to Page]
- (normative) [Go to Page]
- A.1 Test conditions for cookers [Go to Page]
- A.1.1 General
- A.1.2 Hotplates
- Table A.1 – Test conditions for hotplates
- A.1.3 Baking ovens
- A.1.4 Grills
- A.1.5 Baking oven/grill combinations
- A.1.6 Microwave ovens
- A.2 Test conditions for lighting and similar equipment
- A.3 Test conditions for washing machines
- A.4 Test conditions for tumbler dryers
- A.5 Test conditions for refrigerators
- A.6 Test conditions for copying machines, laser printers and similar appliances
- A.7 Test conditions for vacuum cleaners
- A.8 Test conditions for food mixers
- A.9 Test conditions for portable tools
- A.10 Test conditions for hairdryers
- A.11 Test conditions for television sets, audio-equipment, computers, DVDs and similar electronic equipment
- A.12 Test conditions for direct water heaters
- A.14 Test conditions for air conditioners, dehumidifiers, heat pumps, and commercial refrigerating equipment
- A.15 Test conditions for arc welding equipment and allied processes
- A.15.1 General
- A.15.2 Evaluation of Pst
- A.15.2.1 General [Go to Page]
- Table A.2 – Electrode parameters
- A.15.2.2 Test procedure A
- A.15.2.3 Test procedure B
- A.15.2.4 Pst evaluation process
- Table A.3 – Frequency factor R related to repetition rate "r"
- A.15.3 Test procedure for dc
- A.15.3.1 General
- A.15.3.2 Evaluation of dc
- Annex B [Go to Page]
- (normative) [Go to Page]
- B.1 Overview
- B.2 Procedure
- Annex C [Go to Page]
- (informative) [Go to Page]
- C.1 Overview
- C.2 Terms and definitions [Go to Page]
- C.2.1
- C.2.2
- C.2.3
- C.2.4
- steady state voltage change
- C.2.5
- C.2.6
- C.2.7
- C.2.8 [Go to Page]
- d(t)
- C.3 Steady state voltage, and voltage change characteristics
- C.4 Pictorial description of the directly measured parameters dc, d(t), dmax,and Tmax [Go to Page]
- Figure C.1 – Evaluation of Uhp(t)
- Annex D [Go to Page]
- (informative) [Go to Page]
- Table D.1 – Input relative voltage fluctuation ∆V/V for Pst = 1,0 at output
- Bibliography
- 30323458_NEW.pdf [Go to Page]
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- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Assessment of voltage changes, voltage fluctuations and flicker [Go to Page]
- 4.1 Assessment of a relative voltage change, d(t)
- 4.2 Assessment of the short-term flicker value, Pst [Go to Page]
- 4.2.1 General
- 4.2.2 Flickermeter
- 4.2.3 Simulation method
- 4.2.4 Analytical method
- Tables [Go to Page]
- Table 1 – Assessment method [Go to Page]
- 4.2.5 Use of Pst = 1 curve
- 4.3 Assessment of long-term flicker value, Plt
- 5 Limits
- 6 Test conditions [Go to Page]
- 6.1 General
- 6.2 Measurement uncertainty
- 6.3 Test supply voltage
- 6.4 Reference impedance
- 6.5 Observation period
- 6.6 General test conditions
- Figures [Go to Page]
- Figure 1 – Reference network for single-phase and three-phase supplies derived from a three-phase, four-wire supply
- Figure 2 – Curve for Pst = 1 for rectangular equidistant voltage changes
- Figure 3 – Shape factors F for double-step and ramp-voltage characteristics
- Figure 4 – Shape factors F for rectangular and triangular voltage characteristics
- Figure 5 – Shape factor F for motor-start voltage characteristics having various front times
- Annex A (normative) Application of limits and type test conditionsfor specific equipment [Go to Page]
- Table A.1 – Test conditions for hotplates
- Table A.2 – Electrode parameters
- Table A.3 – Frequency factor R related to repetition rate "r"
- Annex B (normative) Test conditions and procedures for measuringdmax voltage changes caused by manual switching
- Annex C (informative) Determination of steady state voltage and voltage change characteristics, as defined in IEC 61000-4-15:2010 [Go to Page]
- Table C.1 – Test specification for dc – dmax – td(t) > 3,3 % (from Table 12 of IEC 61000-4-15: 2010)
- Table C.2 – Test specification for dc – dmax – td(t) > 3,3 % (from Table 13 of IEC 61000-4-15: 2010)
- Figure C.1 – Evaluation of Uhp(t)
- Annex D (informative) Input relative voltage fluctuation ∆V/V for Pst = 1,0 at output [IEC/TR 61000-3-7:2008] [Go to Page]
- Table D.1 – Input relative voltage fluctuation ∆V/V for Pst = 1,0 at output
- Bibliography [Go to Page]
