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BS EN 60384-2:2005 Fixed capacitors for use in electronic equipment - Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors, 2010
- 60384-2e-mono-ed3XXX.pdf [Go to Page]
- 1 General [Go to Page]
- 1.1 Scope
- 1.2 Object
- 1.3 Normative references
- 1.4 Information to be given in a detail specification [Go to Page]
- 1.4.1 Outline drawing and dimensions
- 1.4.2 Mounting
- 1.4.3 Rating and characteristics [Go to Page]
- 1.4.3.1 Rated capacitance range
- 1.4.3.2 Particular characteristics
- 1.4.3.3 Soldering
- 1.4.4 Marking
- 1.5 Terms and definitions
- 1.6 Marking
- 2 Preferred ratings and characteristics [Go to Page]
- 2.1 Preferred characteristics [Go to Page]
- 2.1.1 Preferred climatic categories
- 2.2 Preferred values of ratings [Go to Page]
- 2.2.1 Rated capacitance (CR)
- 2.2.2 Tolerance on rated capacitance
- 2.2.3 Rated voltage (UR)
- 2.2.4 Category voltage (UC)
- 2.2.5 Rated temperature
- 3 Quality assessment procedures [Go to Page]
- 3.1 Primary stage of manufacture
- 3.2 Structurally similar components
- 3.3 Certified records of released lots
- 3.4 Qualification approval [Go to Page]
- 3.4.1 Qualification approval on the basis of the fixed sample size procedures
- 3.4.2 Tests
- 3.5 Quality conformance inspection [Go to Page]
- 3.5.1 Formation of inspection lots
- 3.5.2 Test schedule
- 3.5.3 Delayed delivery
- 3.5.4 Assessment levels
- 4 Test and measurement procedures [Go to Page]
- 4.1 Visual examination and check of dimensions
- 4.2 Electrical tests [Go to Page]
- 4.2.1 Voltage proof [Go to Page]
- 4.2.1.1 Test circuit
- 4.2.1.2 The following voltages (see Table 5) shall be applied between the measuring points of Table 3 in 4.5.6 of IEC 60384-1, for a period of 1 min for qualification approval testing and for a period of 1 s for the lot-by-lot quality conformance testing.
- 4.2.2 Capacitance
- 4.2.3 Tangent of loss angle (tan () [Go to Page]
- 4.2.3.1 Measuring conditions for measurements at 1 000 Hz
- 4.2.3.2 Requirement for measurements at 1 000 Hz
- 4.2.3.3 Measuring conditions for measurements at 10 kHz
- 4.2.4 Insulation resistance
- 4.3 Robustness of terminations [Go to Page]
- 4.3.1 Initial measurements
- 4.4 Resistance to soldering heat [Go to Page]
- 4.4.1 Conditions: No pre-drying.
- 4.4.2 Final inspection, measurements and requirements
- 4.5 Solderability [Go to Page]
- 4.5.1 Test conditions: No ageing.
- 4.6 Rapid change of the temperature [Go to Page]
- 4.6.1 Initial measurement
- 4.6.2 Number of cycles: 5
- 4.7 Vibration [Go to Page]
- 4.7.2 Final inspection, measurements and requirements
- 4.8 Bump [Go to Page]
- 4.8.1 Initial measurements
- 4.9 Shock [Go to Page]
- 4.9.1 Initial measurements
- 4.10 Climatic sequence [Go to Page]
- 4.10.1 Initial measurements
- 4.10.2 Dry heat
- 4.10.3 Damp heat, cyclic, Test Db, first cycle
- 4.10.4 Cold
- 4.10.5 Low air pressure
- 4.10.6 Damp heat, cyclic, Test Db, remaining cycles
- 4.11 Damp heat, steady state [Go to Page]
- 4.11.1 Initial measurements
- 4.12 Endurance [Go to Page]
- 4.12.1 Initial measurements
- 4.13 Charge and discharge [Go to Page]
- 4.13.1 Initial measurements
- 4.14 Component solvent resistance
- 4.15 Solvent resistance of the marking [Go to Page]
