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eLibrary > BS 7288:2016+A1:2022 Specification for residual current devices with or without overcurrent protection for socket‑outlets for household and similar uses >

BS 7288:2016+A1:2022 Specification for residual current devices with or without overcurrent protection for socket‑outlets for household and similar uses, 2022

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BS 7288:2016+A1:2022 Specification for residual current devices with or without overcurrent protection for socket‑outlets for household and similar uses, 2022

Foreword
0 Introduction
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Classification [Go to Page]
4.1 Classification according to behaviour resulting from failure of the line voltage
4.2 Classification according to the design
4.3 Classification according to behaviour in presence of d.c. components
4.4 Classification according to the provision for earthing
4.5 Classification according to the design of the cover plate
4.6 Classification according to the method of mounting
4.7 Classification according to the environmental conditions
4.8 Classification according to the type of terminals
4.9 Classification according to overcurrent protection
4.10 Type of SRCD
4.11 Number of poles
4.12 Type of switching
5 Characteristics of SRCDs [Go to Page]
5.1 Summary of characteristics
5.2 Characteristics common to all socket‑outlet residual current devices
5.3 Characteristics specific to SRCDs with overcurrent protection (see 4.9)
5.4 Preferred or standard values
Table 1 — Standard values of maximum break time of SRCDs for a.c. residual current
Table 2 — Standard values of maximum break time of SRCDs for pulsating d.c. residual current
5.5 Text deleted
6 Marking and other product information [Go to Page]
6.1 General
Table 4 — Position of marking
6.2 Additional marking for screwless terminals
6.3 Void
7 Standard conditions for operation in service and for installation [Go to Page]
Table 5 — Values of influencing quantities
8 Requirements for construction and operation [Go to Page]
8.1 General
8.2 Information and marking
8.3 Mechanical and electrical design
Table 6 — Minimum clearances and creepage distances
8.4 Operating characteristics
Table 7 — Tripping current limits
8.5 Void
8.6 Test device
8.7 Temperature rise
Table 8 — Temperature‑rise values
8.8 Resistance to humidity
8.9 Dielectric properties
8.10 EMC compliance and unwanted tripping
8.11 Behaviour of SRCDs in case of overcurrent conditions
8.12 Resistance of the insulation against impulse voltages
8.13 Mechanical and electrical endurance
8.14 Resistance to mechanical shock
8.15 Reliability
8.16 Protection against electric shock and degree of protection IP of the SRCD
8.17 Resistance to heat
8.18 Resistance to abnormal heat and to fire
8.19 Behaviour of SRCDs within ambient temperature range
8.20 Resistance to temporary overvoltages
Table 11 — Withstand values and duration of temporary overvoltages
9 Tests [Go to Page]
9.1 General
Table 12 — Test copper conductors corresponding to the rated currents
Table 13 — Type testing schedule
9.2 Marking and test of indelibility of marking
9.3 Verification of the trip‑free mechanism
9.4 Test for the verification of electronic circuits
Table 14 — Maximum permissible temperatures under abnormal conditions
9.5 Requirements for capacitors and specific resistors and inductors
9.6 Test of reliability of screws, current‑carrying parts and connections
Table 15 — Screw thread diameters and applied torques
9.7 Screwed and screwless terminals
Table 16 — Relationship between rated current and connectable nominal cross‑sectional areas of copper conductors
Table 17 — Values for flexing under mechanical load test for copper conductors
Table 18 — Values for pull test for screw‑type terminals
Table 19 — Composition of conductors
Table 20 — Tightening torques for the verification of the mechanical strength of screw‑type terminals
Table 21 — Relationship between rated current and connectable cross‑sectional areas of copper conductors for screwless terminals
Table 22 — Value for pull test for screwless‑type terminals
Table 23 — Values for flexing under mechanical load test for copper conductors
Table 24 — Test current for the verification of electrical and thermal stresses in normal use for screwless terminals
Table 25 — Nominal cross‑sectional areas of rigid copper conductors for deflection test of screwless terminals
Table 26 — Deflection test forces
9.8 Verification of the operating characteristics of type AC and type A SRCDs
Table 27 — Tripping current ranges for SRCDs in case of pulsating d.c. current
9.9 Void
9.10 Verification of the test device
9.11 Verification of the limit of temperature rise
Table 27A — Loading of SRCDs for temperature rise test
9.12 Resistance to humidity
9.13 Test of dielectric properties
9.14 EMC compliance and unwanted tripping
Table 28 — Tests to be applied for EMC
9.15 Verification of the behaviour of the SRCD under overcurrent conditions
Table 29 — Tests to verify the behaviour of SRCDs under overcurrent conditions
Table 30 — Power factor ranges of the test circuit
9.16 Verification of clearances of the SRCD with the impulse withstand voltage test
Table 31 — Test voltage for verification of impulse withstand voltage between poles
Table 32 — Test voltage for verification of impulse withstand voltage with the metal support
9.17 Mechanical and electrical endurance
Table 33 — Cross‑sectional area for test conductors
9.18 Resistance to mechanical shock
Table 34 — Height of fall for impact tests
Table 35 — Torque test values for glands
9.19 Reliability
9.20 Protection against electric shock and degree of protection IP of the SRCD
9.21 Resistance to heat
9.22 Resistance to abnormal heat and to fire – Glow‑wire test
9.23 Text deleted
9.24 Verification of ageing of electronic components
9.25 Verification of the behaviour of the SRCD under temporary overvoltage conditions
9.26 Tests for reverse polarity (see 8.3.1)
9.27 Resistance to excessive residual stress test
Figure 1 — Standard test finger
Figure 2 — General test circuit
Figure 3 — Minimum creepage distances and clearances as a function of peak value of voltage
Figure 4 — Minimum creepage distances and clearances as a function of peak value of operating voltage
Figure 5 — Pillar terminals
Figure 6 — Screw terminals and stud terminals
Figure 7 — Saddle terminals
Figure 8 — Saddle terminals
Figure 9 — Arrangement for checking damage to conductors
Figure 10 — Information for deflection test
Figure 11 — Example of a test circuit with current and voltage derived from separate sources
Figure 12 — Test cycle for low temperature test
Figure 13 — Void
Figure 14 — Test circuit for the verification of the correct operation of SRCDs, in the case of residual pulsating direct currents
Figure 15 — Test circuit for the verification of the correct operation of SRCDs, in the case of residual pulsating direct currents superimposed by a smooth direct current
Figure 16 — Damped oscillator current wave 0,5 μs/100 kHz
Figure 17 — Example of test circuit for the verification of resistance against unwanted tripping due to surge currents to earth resulting from impulse voltages for SRCDs
Figure 18 — Test circuit for the verification of the rated making and breaking capacity and of the coordination
Figure 19 — Test apparatus for the verification of the minimum I2t and Ip values to be withstood by the SRCD [9.15.2.1a)]
Figure 20 — Gauge for checking non‑accessibility of live parts
Figure 21 — Impact‑test apparatus
Figure 22 — Details of the striking element
Figure 23 — Mounting support for specimens
Figure 24 — Mounting block for flush‑type SRCDs
Figure 25 — Reliability test cycle
Figure 26 — Ball‑pressure test apparatus
Figure 27 — Sketches and table showing the application of the blows
Figure 28 — Diagrammatic representation of 9.22
Figure 29 — Test circuit for the verification of TOV withstand (9.25) A)
Annex A (normative) Test sequence and number of samples to be submitted for verification of conformity [Go to Page]
Table A.1 — Type testing schedule
Table A.2 — Number of samples for full test procedure
Table A.3 — Number of samples for simplified test procedure
Annex B (normative) Determination of clearances and creepage distances [Go to Page]
Figures B.1 to B.10 — Illustrations of the application of creepage distances
Annex C (informative) Text deleted
Annex D (normative) Routine tests
Annex E (informative) Methods of determination of short‑circuit power factor
Annex F (informative) Differences between BS 7822:2016 and IEC 62640:2011 (with the common modifications) [Go to Page]
Table F.1 — Differences between BS 7288:2016 and IEC 62640:2011/HD 62640:2015
Bibliography [Go to Page]

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